An event related potentials study of the effects of age, load and maintenance duration on working memory recognition

  1. Pinal, D.
  2. Zurrón, M.
  3. Díaz, F.
Journal:
PLoS ONE

ISSN: 1932-6203

Year of publication: 2015

Volume: 10

Issue: 11

Type: Article

DOI: 10.1371/JOURNAL.PONE.0143117 GOOGLE SCHOLAR lock_openOpen access editor

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