Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge

  1. Domínguez-Pumar, M.
  2. Gorreta, S.
  3. Pons-Nin, J.
  4. Gómez-Rodríguez, F.
  5. González-Castaño, D.M.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2015

Volume: 55

Issue: 9-10

Pages: 1926-1931

Type: Article

DOI: 10.1016/J.MICROREL.2015.06.084 GOOGLE SCHOLAR
Data source: Scopus